Mitsubishi Electric Logic for Windows Operating Manual v2

A - 1

SAFETY PRECAUTIONS (Always read these instructions before using this equipment.)

Before using this product, please read this manual and the relevant manuals introduced in this manual carefully and pay full attention to safety to handle the product correctly. The instructions given in this manual are concerned with this product. For the safety instructions of the programmable controller system, please read the CPU module user's manual. In this manual, the safety instructions are ranked as "DANGER" and "CAUTION".

! DANGER

CAUTION!

Indicates that incorrect handling may cause hazardous conditions, resulting in death or severe injury.

Indicates that incorrect handling may cause hazardous conditions, resulting in medium or slight personal injury or physical damage.

Note that the ! CAUTION level may lead to a serious consequence according to the circumstances. Always follow the instructions of both levels because they are important to personal safety.

Please save this manual to make it accessible when required and always forward it to the end user.

[Cautions Regarding Test Operation]

! DANGER

The ladder logic test tool (LLT) simulate an actual PLC to debug sequence programs. However, the execution of a debugged sequence program cannot be guaranteed. After debugging using the ladder logic test tool (LLT), connect an actual PLC and debug the sequence program normally before starting actual operation. Failure to correctly debug a sequence program may result in accidents due to incorrect outputs of operations.

The simulated result may differ from actual operation because the ladder logic test tool (LLT) cannot access I/O units or special function units and do not support some instructions or device memory. After debugging using the ladder logic test tool (LLT), connect an actual PLC and debug the sequence program normally before starting actual operation. Failure to correctly debug a sequence program may result in accidents due to incorrect outputs of operations.

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REVISIONS The manual number is given on the bottom left of the back cover.

Print Date Manual Number Revision

Sep., 1999 SH-080034-A First edition

This manual confers no industrial property rights or any rights of any other kind, nor does it confer any patent licenses. Mitsubishi Electric Corporation cannot be held responsible for any problems involving industrial property rights which may occur as a result of using the contents noted in this manual.

1999 MITSUBISHI ELECTRIC CORPORATION

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INTRODUCTION

Thank you for purchasing the Mitsubishi general-purpose MELSEC series sequencer. Read this manual and make sure you understand the functions and performance of MELSEC series sequencer thoroughly in advance to ensure correct use.

CONTENTS

Safety Precautions ......................................................................................................................................... A- 1 Revisions......................................................................................................................................................... A- 2 Contents.......................................................................................................................................................... A- 3 About Manuals................................................................................................................................................ A- 6 About the Generic Terms and Abbreviations................................................................................................. A- 7

1. OUTLINE OF LADDER LOGIC TEST TOOL (LLT) 1- 1 to 1- 6

1.1 Features of the Ladder Logic Test Tool (LLT)........................................................................................1- 2 1.2 Differences To Debugging with an Actual PLC Connected ...................................................................1- 5

2. SPECIFICATIONS 2- 1 to 2- 22

2.1 Table of Functions...................................................................................................................................2- 1 2.2 Function List ............................................................................................................................................2- 3 2.3 Devices and Instructions Supported by the Ladder Logic Test Tool (LLT) ...........................................2- 6 2.4 Ladder Logic Test Tool (LLT) Restrictions and Cautions ......................................................................2- 7

2.4.1 Restrictions and cautions common to each type of CPU................................................................2- 7 2.4.2 Restrictions and cautions for the A Series CPU functions ..............................................................2-10 2.4.3 Restrictions and cautions for the QnA Series CPU functions .........................................................2-12 2.4.4 Restrictions and cautions for the FX Series CPU functions............................................................2-15 2.4.5 Restrictions and cautions for the Motion controller CPU functions.................................................2-17 2.4.6 Restrictions and precautions for the Q series CPU functions.........................................................2-18

2.5 Ladder Logic Test Tool (LLT) Safety and Handling Precautions...........................................................2-22

3. COMMON OPERATIONS FOR THE LADDER LOGIC TEST TOOL (LLT) 3- 1 to 3-24

3.1 Procedure from Installation to Debugging ..............................................................................................3- 1 3.2 GPPW Operations before Debugging ....................................................................................................3- 3 3.3 Description of the Initial Window Display................................................................................................3- 5 3.4 Screen Operations ..................................................................................................................................3- 6

3.4.1 Basic screen operations ...................................................................................................................3- 6 3.4.2 Device Memory Monitor operations .................................................................................................3-12 3.4.3 I/O system settings operations.........................................................................................................3-18 3.4.4 Timing chart operations....................................................................................................................3-20

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4. SIMULATION OF EXTERNAL DEVICE OPERATION --- I/O SYSTEM SETTING FUNCTIONS 4- 1 to 4- 10

4.1 Simulation with the I/O System Setting Functions .................................................................................4- 2 4.2 Checking Current I/O System Setting Status .........................................................................................4- 6 4.3 Stopping Current I/O System Setting Operation ....................................................................................4- 7 4.4 Saving I/O System Settings to File .........................................................................................................4- 8 4.5 Reading the I/O System Setting File.......................................................................................................4-10

5. MONITORING DEVICE MEMORY --- MONITOR TEST FUNCTION 5- 1 to 5- 22

5.1 GPPW and Ladder Logic Test Tool (LLT) Monitor Test Functions .......................................................5- 1 5.2 Monitoring/Testing the Device Memory..................................................................................................5- 2

5.2.1 Displaying the timing chart for devices ............................................................................................5- 2 5.2.2 Selecting the devices for the monitor test........................................................................................5- 3 5.2.3 Stopping and restarting the device memory monitor.......................................................................5- 5 5.2.4 Changing the monitor communications interval ..............................................................................5- 6 5.2.5 Changing the device memory monitor format .................................................................................5- 7 5.2.6 Changing the window display format ...............................................................................................5- 8 5.2.7 Running the device test....................................................................................................................5-12

5.3 Using Timing Chart..................................................................................................................................5-13

6. SAVING AND READING THE DEVICE AND BUFFER MEMORIES --- TOOL FUNCTIONS 6- 1 to 6- 6

6.1 Saving the Device and Buffer Memories ................................................................................................6- 1 6.2 Reading Saved Device Memory or Buffer Memory Data.......................................................................6- 3

7. EXAMPLES OF LADDER LOGIC TEST TOOL (LLT) APPLICATIONS 7- 1 to 7- 18

7.1 Debugging Using GPPW Step Execution Function ...............................................................................7- 3 7.2 A/QnA Series Special Function Module Program Debugging Example................................................7- 5 7.3 Using Timing Chart Display for Debugging ............................................................................................7- 9 7.4 Using I/O System Settings for Debugging..............................................................................................7-13

8. TROUBLESHOOTING 8- 1 to 8- 8

8.1 Error Messages Displayed on the LED Indicators .................................................................................8- 1

APPENDICES Appendix- 1 to Appendix- 42

Appendix 1 List of Supported Devices............................................................................................ Appendix- 1 Appendix 1.1 The A Series CPU function ladder logic test tool (LLT) ....................................... Appendix- 1 Appendix 1.2 The QnA Series CPU function ladder logic test tool (LLT) .................................. Appendix- 4 Appendix 1.3 FX Series CPU function ladder logic test tool (LLT) ............................................ Appendix-10 Appendix 1.4 Ladder logic test tool (LLT) for Q series CPU (A mode) functions ...................... Appendix-23 Appendix 1.5 Ladder logic test tool (LLT) for Q series CPU (Q mode) functions...................... Appendix-23

Appendix 2 List of Supported Instruction........................................................................................ Appendix-28 Appendix 2.1 A series CPU function ladder logic test tool (LLT) ............................................... Appendix-28

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Appendix 2.2 QnA series function ladder logic test tool (LLT) ................................................... Appendix-30 Appendix 2.3 FX series function ladder logic test tool (LLT)...................................................... Appendix-32 Appendix 2.4 Ladder logic test tool (LLT) for Q series CPU (A mode) functions ...................... Appendix-37 Appendix 2.5 Ladder logic test tool (LLT) for Q series CPU (Q mode) functions...................... Appendix-37

Appendix 3 List of Devices Usable with the I/O System Settings.................................................. Appendix-39

INDEX Index- 1 to Index- 2

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About Manuals

The following manuals are also related to this product. In necessary, order them by quoting the details in the tables below.

Related Manuals

Manual Name Manual Number

(Model Code)

GPP Function software package for Windows SW4D5C-GPPW-E(V) /Ladder Logic Test Tool Function software package SW4D5C-LLT-E(V) Operating Manual (Start up)

Describes the system configuration, installation procedure, and start-up procedure of the SW4D5-

GPPW-E(V) and SW4D5C-LLT-E(V) software packages. (Printed form) (Packed with the product)

IB-080056

(13J962)

GPP Function software package for Windows SW4D5C-GPPW-E(V) Operating Manual

Describes the online functions of SW4D5C-GPPW-E(V) including the programming procedure, printing

out procedure, monitoring procedure, and debugging procedure. (Printed form) (Optionally available)

SH-080032

(13J963)

REMARK

For the GPP Function software package for Windows SW4D5C-GPPW-E(V) Operating Manual, the software package and manual are contained on a single CD- ROM as a set. If you need the GPP function software for Windows SW4D5C-GPPW-E(V) Operating Manual and the Ladder Logic Test Tool Function software package for Windows SW4D5C-LLT-E(V) Operating Manual separately from the software, they are optionally available in printed form.

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About the Generic Terms and Abbreviations

Unless otherwise specified, the table below defines the abbreviations and terminology of the ladder logic test tool software package of model SW4D5C-LLT-E(V) used in this manual.

Generic Term/Abbreviation Description

Ladder logic test tool (LLT) Abbreviation for "SW4D5C-LLT-E(V) ladder logic test tool functions software package" GPPW Abbreviation for "SW D5C-GPPW-E(V) function software package" Windows 95 Abbreviation for "Microsoft Windows 95 (English version)" Windows 98 Abbreviation for "Microsoft Windows 98 (English version)" Windows NT 4.0 Abbreviation for "Microsoft Windows NT Workstation 4.0 (English version)" Debug Locating and correcting errors in a sequence program to create a correct program.

Device memory Areas to store device data in the ladder logic test tool (LLT), including inputs (X), outputs (Y), relays (M), timers (T), data registers (D), etc.

Monitor Monitoring to determine the ON/OFF status of bit devices or the PV of word devices.

Simulations Test execution of a program on a personal computer with the ladder logic test tool (LLT) installed, instead of execution in an actual PLC.

Timing chart Functions to visually confirm ON/OFF status of a bit device or the change in value of a word device.

WDT error An error issued when a sequence program is written in such a way that it runs an infinite loop.

Pseudo-sequence program Indicates a sequence program created by the ladder logic test tool (LLT) to realize the settings of I/O System Settings.

A Series CPU A0J2H, A1FX, A1S (S1), A1SJ, A1SH, A1SJH, A1N, A2C, A2CJ, A2N (S1), A2S (S1), A2SH (S1), A3N, A2A (S1), A3A, A2U (S1), A2US (S1), A2USH-S1, A3U, A4U, CPU board (A80BD-A2USH-S1)

QnA Series CPU Q2A, Q2AS (H), Q2AS1, Q2AS (H) S1, Q3A, Q4A, Q4AR FX series CPU FX0 (S), FX0N, FX1N, FX2C, FX2N (C) Motion controller CPU A171SH, A172SH, A273UH (S3) Q series CPU Generic term for Q series CPU (A mode) and Q series CPU (Q mode). Q series CPU (A mode) Q02-A, Q02H-A, Q06H-A Q series CPU (Q mode) Q02, Q02H, Q06H, Q12H, Q25H

Microsoft Windows and Microsoft Windows NT are trademarks of Microsoft Corporation U.S.A. Other names of companies and products are also trademarks or registered trademarks of companies.

A - 8

MEMO

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MELSEC 1. OUTLINE OF LADDER LOGIC TEST TOOL (LLT)

1 1. OUTLINE OF LADDER LOGIC TEST TOOL (LLT)

This operating manual describes the functions and operation of the SW4D5C-LLT-E(V) ladder logic test tool functions software package.

The SW4D5C-LLT-E(V) ladder logic test tool functions software package (hereafter "ladder logic test tool (LLT)") is a software package which runs under Windows 95/98/ NT4.0. Offline debugging is possible by adding the ladder logic test tool (LLT) to a computer in which the SW D5C-GPPW- E(V)/SW D5F-GPPW-E(V) GPP function software package (hereafter "GPPW") is installed. The offline debugging functions include the device monitor test and simulated operation of external device I/Os. As the ladder logic test tool (LLT) allow sequence programs to be developed and debugged on a single computer, checking a modified program is quick and easy. GPPW must be installed before these functions can be used.

GPPW Ladder Logic Test Tool (LLT)

Device monitor test, simulated operation of machine side I/Os, etc. are possible.

Connection of PLC is not necessary.

Install

A sequence program created with GPPW can be debugged by writing it to the ladder logic test tool (LLT). The sequence program is automatically written to the ladder logic test tool (LLT) when the ladder logic test tool (LLT) are started up. See the following manuals for information on operations not covered in this manual:

GPP Function software package for Windows SW4D5C-GPPW-E(V)/Ladder Logic Test Tool Functions software package SW4D5C-LLT-E(V) Operating Manual (Start up) ............................................................................................................ IB-080056

GPP Function software package for Windows SW4D5C-GPPW-E(V) Operating Manual ................................................................................ SH-080032

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MELSEC 1. OUTLINE OF LADDER LOGIC TEST TOOL (LLT)

1.1 Features of the Ladder Logic Test Tool (LLT)

The main features of the ladder logic test tool (LLT) are described below.

(1) Can be utilized as a single program debugging tool Using the PLC for debugging in the conventional method required not only the PLC but also I/O and special function modules, external device, etc. to be prepared as needed. When using the ladder logic test tool (LLT), you can perform debugging on a single personal computer because I/O System Settings for external device simulation and the simulation function for special function module buffer memory are available in addition to the simulation function for PLC. Also, because of no connection to actual equipment, you can proceed with debugging safely if an abnormal output should occur due to a program bug.

GPPW

Communication

Conventional debugging

Batch monitor (device memory) Batch monitor (buffer memory)

Ladder monitor

Power supply

CPU I/O module Special function module

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MELSEC 1. OUTLINE OF LADDER LOGIC TEST TOOL (LLT)

1) ... Key switch, indicator display function 2) ... Function to simulate CPU operation 3) ... Function to simulate CPU device memory 4) ... Function to simulate the buffer memory area of a special function module 5) ... Function to batch-monitor device memory values 6) ... Function to display device memory changes in a chart form 7) ... Function to simulate I/O operation of external device 8) ... Function to save/read device memory or buffer memory data to/from a file

Debugging using ladder logic test tool (LLT)

GPPW

Ladder monitor Batch monitor (device memory) Batch monitor (buffer memory)

1) Basic screen

2) CPU simulation function

3) Device memory simulation function

4) Buffer memory simulation function

5) Device batch monitor 6) Timing chart 7) I/O system settings 8) Tool function

LLT

Communication

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MELSEC 1. OUTLINE OF LADDER LOGIC TEST TOOL (LLT)

(2) Comparison between PLC and ladder logic test tool (LLT) There are the following differences between connection with a PLC and use of the ladder logic test tool (LLT).

An AnA AnU

Q (A mode) FX QnACPU Q (Q mode) Refer To

Device range 1 1 1 8 8 Appendix-

1

Instruction

(common) 2 2 2 6 9 9

Appendix-

24

Instruction

(dedicated) 3 3

Appendix-

25

Parameter 4 4 4 7 10 10 2-9

Network

parameter 2-9

Special function

module 5 5 5 5 5 5

: Supported : Unsupported : Irrelevant

1: Device I is not supported.

2: Output instructions, program branch instructions, data processing instructions, display instructions and

other instructions include unsupported instructions.

3: Structured program instructions, I/O operation instructions, character string processing instructions,

clock instructions, data link instructions and special module instructions include unsupported

instructions.

4: Memory capacity setting, PLC RAS setting, PLC system setting and device setting include

unsupported items.

5: Only the buffer memory area is supported. The size of the buffer memory area is fixed to 16K points.

The QCPU (Q mode) is fixed to 64K points.

6: Program flow instructions, high-speed processing instructions, convenient instructions, external device

instructions and clock instructions include unsupported instructions.

7: Memory capacity setting, device setting, PLC name setting, PLC system setting (1) and PLC system

setting (2) include unsupported items.

8: Devices S, Jn\X, Jn\Y, Jn\B, Jn\SB, Jn\W, Jn\SW, I, BL and TR are unsupported.

9: Output instructions, program execution instructions, I/O refresh instructions, other convenient

instructions, data processing instructions, structured instructions, display instructions, debugging,

diagnostic instructions, character string processing instructions, special function instructions, data

control instructions, clock instructions, peripheral device instructions and other instructions include

unsupported instructions.

10: PLC name setting, PLC system setting, PLC file setting, PLC RAS setting, device setting, boot file

setting and SFC setting include unsupported items.

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MELSEC 1. OUTLINE OF LADDER LOGIC TEST TOOL (LLT)

1.2 Differences To Debugging with an Actual PLC Connected

The specifications for debugging using the ladder logic test tool (LLT) differ from those for debugging with an actual PLC connected. The main differences between debugging using the ladder logic test tool (LLT) and debugging with an actual PLC connected are shown below. See Section 2.4 for details.

Item Name Debugging with an Actual PLC

Connected Debugging with Ladder Logic Test Tool (LLT)

Applicable

CPU

Step execution,

skip execution,

partial execution

Not supported by FX Series CPU

functions

Debugging using step execution, skip execution, and

partial execution makes debugging operation more

efficient.

FXCPU

Device range

check

Operation continues even if the

indirect designation by the index

register exceeds the device range.

"OPERATION ERROR" occurs when the device range

determined by CPU type or parameters is exceeded.

(For the device range for a specific CPU type, refer to

Appendix 1.)

ACPU

QnACPU

FXCPU

Motion

controller

CPU

QCPU

Real number range

check

Dedicated instructions to handle

real numbers allow operation to

continue when an illegal value

occurs which cannot be evaluated

as a real number.

Real number range checks are conducted rigorously.

"OPERATION ERROR" is displayed if a value cannot be

evaluated as a real number.

ACPU

QnACPU

Motion

controller

CPU

QCPU

Number range

check

Value 0 is given as a result of "0

divided by 0" by DIV instruction,

floating point division, of the A

series PLC.

No error occurs.

The rigorous number range check can detect an illegal 0

denominator and "OPERATION ERROR" is generated if

0 0 is executed.

ACPU

Motion

controller

CPU

QCPU

(A mode)

Illegal instruction in

a dedicated

instruction

The illegal instruction is ignored and

operation continues.

The illegal instruction is checked and "INSTRCT CODE

ERR." is displayed. Dedicated instructions must be

described as blocks.

(Example of illegal ladder)

RADLEDA

D200LEDC

K120DM0V

LEDR

D500

LEDC D210

END

Illegal instruction

M9036

ACPU

Motion

controller

CPU

QCPU

(A mode)

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MELSEC 1. OUTLINE OF LADDER LOGIC TEST TOOL (LLT)

Item Name Debugging with an Actual PLC

Connected

Debugging with Ladder Logic Test

Tool (LLT)

Applicable

CPU

Time concept Actual time As per constant scan setting.

ACPU QnACPU FXCPU Motion controller CPU

QCPU

Supported

instructions All instructions can be used.

Since data refresh instructions, PID control instructions

(QnA series, FX series CPUs), etc. cannot be used, they

are processed as NOPs.

(Refer to Appendix-2 for supported instructions.)

ACPU QnACPU FXCPU Motion controller CPU

QCPU

Operating CPU

type According to CPU type used.

Operates as A4UCPU when an A Series CPU is

selected, Q4ACPU when QnA Series CPU is selected,

FXCPU when FX Series CPU is selected, or A4UCPU

when motion controller CPU is selected.

ACPU QnACPU FXCPU Motion controller CPU

QCPU

Special function

module

(special block)

Supported

Not supported.

Only the buffer memory area of a special function

module (special block) is supported.

ACPU QnACPU FXCPU Motion controller CPU

QCPU (A-mode)

I/O module Supported Not supported

ACPU QnACPU FXCPU Motion controller CPU

QCPU

Network Supported Not supported

ACPU QnACPU FXCPU Motion controller CPU

QCPU

Memory cassette

capacity

An error occurs in GPPW if data

exceeding the memory cassette

capacity is written to the PLC.

No error occurs and normal operation continues if data

exceeding the memory cassette capacity is written to

the PLC.

ACPU QnACPU Motion controller CPU

QCPU

Intelligent function

module (intelligent

parameters)

(Future extension)

Supported Only the initial setting, automatic refresh setting and

buffer memory area are supported.

QCPU (Q mode)

2 - 1

MELSEC 2. SPECIFICATIONS

2

2. SPECIFICATIONS

2.1 Table of Functions

The functions supported by the ladder logic test tool (LLT) are shown below. The functions supported by the ladder logic test tool (LLT) include functions executed from the ladder logic test tool (LLT) menu and functions executed from the GPPW menu. The Ladder Logic Test Tool simulates the function of the CPU selected at the time of execution of the LLT from the GPPW menu: it supports CPU's of type A, QnA, and FX. Also, when the CPU of the motion controller is selected, the corresponding function of the A Series CPU operates. (Refer to Section 2.4.5(1) for the A series CPU corresponding to the motion controller CPU.) Also, when the Q series (Q mode) is selected, the Q series CPU functions operate, but when the Q series (A mode) is selected, the A series CPU functions operate as equivalent to those of the A4UCPU. The functions supported by the ladder logic test tool (LLT) are as indicated in Table 2.1. See the SW4D5C-GPPW Operating Manual for details about the operation of functions executed from the GPPW menu.

Table 2.1 Functions Supported by Ladder Logic Test Tool (LLT)

Function Description Reference

Ladder monitor

Device monitor

Monitors the processing status of the ladder logic test

tool (LLT)

Device test Forcibly write device values to the ladder logic test tool

(LLT) during monitoring.

Write to PLC Writes parameter file and program file to ladder logic

test tool (LLT).

PLC diagnostics Checks the ladder logic test tool (LLT) status and errors.

Skip execution Skips program execution in the range between two

designated steps.

Partial execution Executes the part of the program in a designated step

or pointer range.

Step execution Executes the sequence program one step at a time.

Remote operation Operates the ladder logic test tool (LLT) execution

status.

Functions

executed from

the GPPW

menu

Program monitor

list

Monitors the program execution status and number of

executions as a table, starts and stops the program

execution in the table.

See the SW4D5C-

GPPW-E (V)

Operating Manual

2 - 2

MELSEC 2. SPECIFICATIONS

Function Description Reference

I/O system settings Simulates the operation of external devices by simple

settings. See Chapter 4.

Monitor test

Conducts testing by monitoring the device memory

status.

Displaying the ON/OFF chart of the devices.

Forcing the devices ON/OFF, and changing present

values.

See Chapter 5.

Tools Saves and reads the device memory and buffer

memory. See Chapter 6.

Function equivalent

to WDT

Issues a WDT error if a sequence program is written in

such a way that it runs an infinite loop.

Error detail display

function

Displays detailed error information at occurrence of an

error.

Functions

executed from

the ladder

logic test tool

(LLT) menu

Unsupported

instruction list

display function

Lists the instructions which are not supported by the

ladder logic test tool (LLT) if they are included in a

sequence program.

See Chapter 3.

2 - 3

MELSEC 2. SPECIFICATIONS

2.2 Function List

This section provides the function list of each screen.

(1) Basic screen function list

Device Memory Monitor.....................................

Start

I/O System Settings...........................................

I/O System Status............................................

Clear I/O Settings...............................................

Shows the Device Memory Monitor screen.

Shows the I/O System Settings screen.

Shows the file name of the data of the I/O system settings being executed.

Stops the operation of the I/O system settings being executed.

Backup Device Memory.....................................

Tools

Backup Buffer Memory...........................................

Writes device memory data to a file.

Writes buffer memory data to a file.

Restore Device Memory.....................................

Restore Buffer Memory...........................................

Reads the saved device memory data.

Reads the saved buffer memory data.

About LLT..........................................................

Help

Shows the product information.

2 - 4

MELSEC 2. SPECIFICATIONS

(2) Device Memory Monitor screen function list

Start

Exit.................................................................

Timing Chart

Run.................................................................

Device Memory

Bit Device

Bit device corresponding to CPU............

Word Device

Word device corresponding to CPU.......

Monitor

Start/Stop.......................................................

Monitoring Interval..........................................

Display

Starting Page..................................................

Previous Page................................................

Next Page.......................................................

End Page........................................................

Value

Decimal..................................................

Jump...............................................................

Hexadecimal...........................................

View

Sixteen Bit Integer.................................

Thirty Two Bit Integer.............................

Real.........................................................

1: Active window: Window which is made operable among several windows.

Closes the Device Memory Monitor screen.

Starts the Timing Chart screen.

Shows the window of the selected bit device.

Shows the window of the selected word device.

Starts/stops monitor.

Changes the monitoring interval.

Shows the first page in the active window 1.

Shows the preceding page in the active window 1.

Shows the next page in the active window 1.

Shows the last page in the active window 1.

Shows decimal values in the active window 1.

Shows the specified device and onward in the active window 1.

Shows hexadecimal values in the active window 1.

Shows 16-bit integers in the active window 1.

Shows 32-bit integers in the active window 1.

Shows real numbers in the active window 1.

2 - 5

MELSEC 2. SPECIFICATIONS

Window

New.........................................................................Opens a new window with the specified device.

Cascade.........................................................................Cascades currently open windows.

Tile.........................................................................Tiles currently open windows.

Arrange .........................................................................Arranges windows reduced to icons.

(3) I/O System Settings screen function list Settings

Open File.........................................................................

Save File.........................................................................

Set Device.........................................................................Specifies the device to entered.

Exit .........................................................................Exits from I/

Reads the saved I/O system settings.

Writes the I/O system settings.

O system settings.

(4) Timing Chart function list File

Open File.........................................................................Reads the saved monitor device data.

Save File As.........................................................................Writes the device data currently monitored.

Exit.........................................................................Exits from Timing Chart.

Device

Enter Device......................................................................Registers the devices to be monitored.

Delete Device........................................................................Deletes the selected devices.

Property.......................................................................Change the display format of the selected device.

List Device........................................................................Lists the devices being monitored.

Monitor

Start/Stop......................................................................Starts/stops monitor.

Sampling period..............................................To change the Data accumulation interval.

2 - 6

MELSEC 2. SPECIFICATIONS

2.3 Devices and Instructions Supported by the Ladder Logic Test Tool (LLT)

The ladder logic test tool (LLT) for the A Series, QnA Series, FX Series, Q Series and Motion controller CPU functions operates in the following ranges of devices and instructions.

Function Name CPU Type Device Instruction

A Series CPU

functions

A0J2H, A1FX, A1S(S1), A1SJ, A1SH, A1SJH,

A1N, A2C, A2CJ, A2N(S1), A2S(S1),

A2SH(S1), A3N, A2A(S1), A3A, A2U(S1),

A2US(S1), A2AS(S1), A2AS-S30, A2AS-S60,

A2USH-S1 1, A3U, A4U

Operates in the device range of

the selected CPU type.

(See Appendix 1 (1).)

Operates with the

instructions supported by

the ACPU.

(See Appendix 2 (1).)

QnA Series CPU

functions

Q2A, Q2AS(H), Q2AS1, Q2AS(H)S1, Q3A,

Q4A, Q4AR

Operates in the device range of

the selected CPU type.

(See Appendix 1 (2).)

Operates with the

instructions supported by

the QnACPU.

(See Appendix 2 (2).)

FX Series CPU

functions FX0(S), FX0N, FX1, FX2(C), FX2N(C)

Operates in the device range of

the selected CPU type.

(See Appendix 1 (3).)

Operates with the

instructions supported by

the FXCPU.

(See Appendix 2 (3).)

Motion controller

CPU functions

A171SH (equivalent to A2SH), A172SH

(equivalent to A2SH (S1)), A273UH (S3)

(equivalent to A3U)

Operates in the device range of

the corresponding ACPU.

(See Appendix 1 (1).)

Operates with the

instructions supported by

the ACPU. (See Appendix

2 (1).) However, motion

dedicated instructions

(SVST, CHGA, CHGV,

CHGT, SFCS, ITP) are

not supported. They are

not processed.

Q series CPU

(A mode) function Q02-A, Q02H-A, Q06H-A

Operates in the device range of

the A4UCPU.

Operates with the

instructions supported by

the A4UCPU.

Q series CPU

(Q mode) function Q02, Q02H, Q06H, Q12H, Q25H

Operates in the device range of

the selected CPU type.

Operates with the

instructions supported by

the QCPU (Q mode).

1: Select CPU type of A2USH-S1 when CPU card A80BD-A2USH-S1 is used.

However, some devices and instructions are restricted or are not supported. Unsupported devices and instructions are not processed (NOP). These NOP instructions are shown on the initial screen of the ladder logic test tool (LLT) as unsupported information. (See Section 3.3.) See Appendix 1 List of Supported Devices and Appendix 2 List of Supported Instructions for details about the devices and instructions supported by the ladder logic test tool (LLT).

POINT In this manual, the PLC portion of the motion controller is described as a function of the motion controller CPU. In addition, the A171SH, A172SH, and A273UH(S3) are included in the device/instruction support range of the A2SH, A2SH(S1), and A3U respectively.

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MELSEC 2. SPECIFICATIONS

2.4 Ladder Logic Test Tool (LLT) Restrictions and Cautions

The restrictions and cautions when debugging with the ladder logic test tool (LLT) are described below.

2.4.1 Restrictions and cautions common to each type of CPU.

(1) Ladder logic test tool (LLT) Processing Time The ladder logic test tool (LLT) processing time is calculated using 100 ms per scan. The length of each scan becomes the set constant scan time (default = 100 ms). This is intended to eliminate changes due to computer performance and user- created sequence programs. The scan time can be set to a value other than 100 ms by changing the constant scan time setting. (To change the time, you can use D9020 for the ACPU/QCPU (A mode)/motion controller CPU functions, parameter setting for the QnACPU/QCPU (Q mode) functions, or D8039 for the FXCPU functions.)

(2) About timer count-up In the ladder logic test tool, the count made by the timer instruction during one scan changes with the constant scan setting and timer speed. At the constant scan setting of 100ms, the 100ms timer counts +1 during one scan and the 10ms timer +10 during one scan. At the constant scan setting of 300ms, the 100ms timer counts +3 during one scan and the 10ms timer +30 during one scan, and at the constant scan setting of 10ms, the 100ms timer counts +1 during 10 scans and the 10ms timer +1 during one scan.

(3) Restarting the ladder logic test tool (LLT) When restarting the ladder logic test tool (LLT) immediately after ending it, it may take longer than the usual restarting time.

(4) Device Range Checks using I/O System Settings Appendix 3 shows a table of devices supported by I/O system settings. The usable device ranges depend on the selected CPU model and parameter setting range. (For details, refer to Appendix-1.)

(5) Interrupt Programs Interrupt programs are not supported. Any sequence program created is not executed.

(6) Floating Decimal Point Rounding errors can occur in the results of instructions using the floating decimal point. Therefore, the results may differ from calculations when a CPU is connected.

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MELSEC 2. SPECIFICATIONS

(7) Read from PLC, Compare with PLC Not supported by the ladder logic test tool (LLT).

(8) Comments Not supported by the ladder logic test tool (LLT).

(9) LED Reset Button The LED display is cleared when the LED reset button on the initial window is clicked. However, the display immediately reappears if the cause of the error has not been removed, so it appears that the LED display is not reset when the button is clicked.

(10) Automatic Writing of the Ladder Logic Test Tool (LLT) Parameters and sequence programs are written when the ladder logic test tool (LLT) is started up. As the file register and device initial values are not automatically written, write them to the ladder logic test tool (LLT) using write to PLC. (If you do not perform Write to PLC on GPPW of SW0D5 -GPPW-E(V), the file register/device initial values used are the values which were automatically retained when the ladder logic test tool (LLT) was ended last time.)

(11) Restrictions applied to Combinations with GPPW The following table shows the restrictions that are applied when the LLT is used in combination with the GPPW.

GPPW

SW2D5C/F-

GPPW-E (V)

SW3D5C-

GPPW-E (V)

SW4D5C-

GPPW-E (V)

SW2D5C/F-

LLT-E (V) 1 1 3

SW3D5C-

LLT-E (V) 2 3

Ladder Logic

Test Tool

(LLT) SW4D5C-

LLT-E (V) 2 4 4

: No restrictions

: Partial restrictions

1: Buffer memory monitor for the ladder logic test tool (LLT) can not be executed from

GPPW, when A Series CPU is selected.

2: Can not select buffer memory monitor from GPPW, when the ladder logic test tool

(LLT) for A Series CPU is running.

3: The Q series CPU (Q mode, A mode) ladder logic test tool (LLT) cannot be started

from GPPW.

4: GPPW does not support the Q series CPU (Q mode, A mode).

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MELSEC 2. SPECIFICATIONS

Note

It is not possible to install an English version of the ladder logic test tool (LLT) when a Japanese version GPPW is already installed.

(12) Task Bar Settings If Auto Hide is set in the Windows95/98 task bar settings, the task bar is hidden and not displayed at the bottom of the screen if the GPPW window is displayed at its maximum size and the ladder logic test tool (LLT) initial window is active. The task bar is displayed when the GPPW window is reduced or the GPPW window is set active.

(13) About device range check If the device range is exceeded in indirect designation using the index register, "OPERATION ERROR" occurs in the ladder logic test tool (LLT).

(14) About real number range check The ladder logic test tool (LLT) checks the real number range strictly. If any value cannot be evaluated as a real number, "OPERATION ERROR" occurs.

(15) About supported instructions In the ladder logic test tool (LLT), some instructions are unusable and processed as NOPs. (Refer to Appendix-2 for the supported instructions.)

(16) About operating CPU types When selected, the A series CPU/Q series CPU (A mode) operates as the A4UCPU, the QnA series CPU as the Q4ACPU, the FX series CPU as the FXCPU, the motion controller CPU as the A4UCPU, and the Q series CPU (Q mode) as the Q25HCPU.

(17) About I/O modules The ladder logic test tool (LLT) does not support I/O modules.

(18) About networks The ladder logic test tool (LLT) does not support networks.

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MELSEC 2. SPECIFICATIONS

2.4.2 Restrictions and cautions for the A series CPU functions

(1) Special function module Compatibility The ladder logic test tool (LLT) does not support the special function modules. The special function module buffer memory area capacity is 16 k points 64 units. It is possible to save to and read from this area but any other access results in an error.

(2) Saving To and Reading From Buffer Memory Make I/O assignments with GPPW before saving or reading the special function module buffer memory. (See the SW4D5C-GPPW Operating Manual.) It is not possible to save to and read from the buffer area unless I/O assignments are made.

(3) Enabling and Disabling the Parameter Setting Items Some GPPW parameter settings are disabled by the ladder logic test tool (LLT) even if data is set for them. The settings disabled by the ladder logic test tool (LLT) are sh